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PEM5111 - Physical Metallurgy

Form professor

Prof. Dr. Durval Rodrigues Junior

Workload

Theoretical	Practical	Study	Duration	Total	Credits
3 hours/week	1 hours/week	8 hours/week	15 weeks	180 hours	12

See on Janus (pt-br)

Concentration area

97135 - Conventional and Advanced Materials

Objectives

Motivation

Syllabus

Evaluation criteria

References

1. Scanning Electron Microscopy and X-Ray Microanalysis; J.I. Goldstein, D.E. Newbury, P. Echlin, D.C. Joy, A.D. Romig, Jr., L.E. Lyman, C. Fiori, E. Lifshin; Plenum Press, 1992; Springer, 2003.
2. Principles of Analytical Electron Microscopy; D.C. Joy, A.D. Romig, Jr., J.I. Goldstein; Plenum Press, New York; 1989.
3. Microanalysis of Solids; B. G. Yacobi, D. B. Holt, L. L. Kazmerski; Plenum Press, New York, 1994.
4. Fundamentos de Microscopia; Luiz Henrique Monteiro Leal; Ed. UERJ, 2000.
5. Microscopia dos Materiais; Walter A. Mannheimer; Ed. SBMM e-papers; 2002.
6. The Operation of Transmission and Scanning Electron Microscopes; Dawn Chescoe, Peter J. Goodshew; Oxford Science Publications – Royal Microscopical Society; 1990.
7. Advanced Scanning Electron Microscopy and X-Ray Microanalysis; D.E. Newbury, D.C. Joy, P. Echlin, C.E. Fiori, J.I. Goldstein; Plenum Press, New York; 1987.
8. High-resolution Electron Microscopy; John C. H. Spence; Oxford University Press; 2009.
9. Practical Electron Microscopy – A Beginner´s Illustrated Guide; Elaine Hunter; Cambridge University Press; 1993.
10. Introduction to X-Ray Spectrometric Analysis; Eugene P. Bertin; Plenum Press, New York; 1978.
11. Quantitative X-Ray Spectrometry; Ron Jenkins, R.W. Gould, Dale Gedcke; Marcel Dekker, Inc., New York; 1981.
12. Elements of X-Ray Diffraction; B.D. Cullity; Addison-Welley Publishing Company, Inc.; 1978.
13. Principles and practice of electron microscope operation; A. W. Agar, R. H. Alderson, D. Chescoe; Vol. 2, 6th printing. In Glauert series. Amsterdan: North-Holland; 1987.
14. Optics; E. Hechts; 2nd edition, Addison-Wesley; 1987.
15. Electron microscopy of thin crystals; A. Hirsch et al.; Krieger Publishing Company; 1977.
16. Scanning electron microscopy, x-ray microanalysis, and analytical electron microscopy (A laboratory workbook); C. E. Lyman et al.; Plenum Press; 1990.
17. Transmission electron microscopy (A textbook for Materials Science); D. B. Williams, C. B. Carter; Plenum Press, 1996; Springer, 2009.
18. Specimen Preparation for Transmission Electron Microscopy of Materials; Peter J. Goodhew; Oxford Science Publications – Royal Microscopical Society; 1984.
19. Atomic Force Microscopy; Peter Eaton and Paul West; Oxford University Press, 2010.
20. Atomic Force Microscopy/Scanning Tunneling Microscopy; Ed. Samuel H. Cohen, Mona T. Bray, Marcia L. Lightbody; Plenum Press, 1997.
21. Electron Backscatter Diffraction in Materials Science; Ed. Adam J. Schwartz, Mukul Kumar, Brent L. Adams; Kluwer Academic/Plenum Publishers, 2000.
22. Microscope Image Processing; Qiang Wu, Fatima A. Merchant, Kenneth R. Castleman; Elsevier; 2008.
23. Electron Probe Quantitation; Ed. By K. F. J. Heinrich and Dale E. Newbury; Plenum Press; 1991.
24. Electron Microscopy of Materials – An Introduction; Manfred Von Heimendahl; Academic Press; 1980.
25. Catálogos de Equipamentos e Empresas, distribuídos com autorizações durante o curso.
26. Materiais complementares atualizados em relação à Bibliografia acima.

Esta bibliografia acima já está, em grande parte, disponível na Instituição, mas não é suficiente e atual. Serão também disponibilizados textos técnicos, dissertações e teses, distribuídos com autorizações durante o curso.