PEM5106 - Crystallography and X-ray Diffraction
Form professor
Prof. Dr. Paulo Atsushi Suzuki,
Prof. Dr. Fernando Vernilli Junior
Workload
| Theoretical |
Practical |
Study |
Duration |
Total |
Credits |
| 4 hours/week |
0 hours/week |
8 hours/week |
15 weeks |
180 hours |
12 |
See on Janus (pt-br)
Concentration area
97135 - Conventional and Advanced Materials
Objectives
The purpose of this course is to understand the crystal structure of materials and the use of X-ray diffraction technique for the analysis of crystalline structure of materials.
Motivation
In materials science and engineering the knowledge of crystal structure is fundamental in the development of materials that have some properties (mechanical, thermal, electrical, magnetic, optical). The X-ray diffraction is the main technique used to identify the crystalline phases present in a material, as well as to determine their crystal structures.
Syllabus
- FUNDAMENTALS OF CRYSTALLOGRAPHY: States of matter; crystals; packaging; density; structure (Bravais lattice, basis); Crystallographic planes; Miller indices; Interplanar distances; Symmetries (types, point groups, space groups); Reciprocal lattice.
- X-RAY DIFFRACTION: The X-ray diffraction; Production and detection of X-rays; Bragg’s Law; X-ray diffraction patterns for different states of matter; The powder diffraction; The factors that affect the X-ray intensities.
- APPLICATIONS: Phase identification; Indexing; Refinement of lattice parameters; Determination of the crystallite size; Structural phase transitions; Solid solutions; Phase diagrams; Quantitative analysis; Crystallographic orientation; Computer simulation; Study of single crystals; Systems of low crystallinity; Structural refinement.
Evaluation criteria
The evaluation consists of two written tests of same weight. The concept is based on the average of the notes, calculated from the arithmetic mean of these two notes (P1+P2)/2.
References
- B. D. Cullity e S. R. Stock, Elements of X-Ray Diffraction, 3rd ed., Prentice Hall, New Jersey (2001).
- H. P. Klug e L. E. Alexander, X-Ray Diffraction Procedures for Polycrystalline and Amorphous Materials, John Wiley, New York (1974).
- V. K. Pecharsky, Fundamentals of powder diffraction and structural characterization of materials, Springer, New York (2005).
- B. E. Warren, X-Ray Diffraction, Dover, New York (1990).
- M. M. Woolfson, An introduction to X-ray crystallography, Cambridge (1997).
- C. S. Barret e T. B. Massalski, Structure of Metals: Crystallographic Methods, Principles and Data, Pergamon Press, Oxford (1980).